By Michael K. Miller,Richard G. Forbes
Nanocharacterization via Atom Probe Tomography is a realistic consultant for researchers atomic point characterization of materials with atom probe tomography.
Readers will locate descriptions of the atom probe device and atom probe tomography approach, box ionization, box evaporation and field ion microscopy. the elemental underlying physics ideas are tested, as well as info reconstruction and visualization, statistical information research equipment and specimen education by means of electropolishing and FIB-based strategies. A full description of the neighborhood electrode atom probe – a brand new state of the art software – can be supplied, besides certain descriptions and obstacles of laser pulsing as a mode to box evaporate atoms. necessary assurance of the hot ionization thought is usually integrated, which underpins the final technique.
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